Home > Resources > Inspect Scanning Electron Microscope

Inspect Scanning Electron Microscope

Already a member? Click here to sign in

Step 1: Not registered? Please complete this form to view content

Step 2: Create Your Medical Product Guide Account

Step 3: Create Your Professional Information

* indicates required field

By clicking the button above you agree to our Terms of Use. We take your privacy seriously. For more information please read our Privacy Policy.

Product Specifications from FEI Co

Tailored for the mainstream need to investigate a wide variety of materials and characterize their structure and composition, the easy to use Inspect TM S50 provides flexibility and versatility to handle most research needs. The Inspect provides all the data: surface and compositional images can be combined with elemental analysis for determining material properties and elemental composition.