Inspect Scanning Electron Microscope
Company : FEI Co
UMDC Code : 345059
The Inspect line of tools includes two scanning electron microscopes , one SEM with tungsten and another SEM with FEG, for use where high-resolution imaging is routine. These cost-effective, flexible, state-of-the-art scanning electron microscopes are built using FEIs advanced technology, making them valuable for industrial manufacturers and researchers working with material characterization and inspection applications. These systems can accommodate cryo stages, EDS, WDS and EBSD and are flexible, solid performers. The tungsten Inspect S has both high and low vacuum modes standard and is ideal for routine analysis. The Inspect F is a high current FEG SEM meeting the needs for solid analytical performance and reliability. These instruments are well suited for research, quality and inspection activities.
Product URL : http://www.fei.com/products/scanning-electron-micr
Last Updated : 03/16/2013